Geometrical Charged Particle Optics

Author: Harald Rose
Editor: Springer
ISBN: 3642321194
Size: 15,89 MB
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This second edition is an extended version of the first edition of Geometrical Charged-Particle Optics. The updated reference monograph is intended as a guide for researchers and graduate students who are seeking a comprehensive treatment of the design of instruments and beam-guiding systems of charged particles and their propagation in electromagnetic fields. Wave aspects are included in this edition for explaining electron holography, the Aharanov-Bohm effect and the resolution of electron microscopes limited by diffraction. Several methods for calculating the electromagnetic field are presented and procedures are outlined for calculating the properties of systems with arbitrarily curved axis. Detailed methods are presented for designing and optimizing special components such as aberration correctors, spectrometers, energy filters monochromators, ion traps, electron mirrors and cathode lenses. In particular, the optics of rotationally symmetric lenses, quadrupoles, and systems composed of these elements are discussed extensively. Beam properties such as emittance, brightness, transmissivity and the formation of caustics are outlined. Relativistic motion and spin precession of the electron are treated in a covariant way by introducing the Lorentz-invariant universal time and by extending Hamilton’s principle from three to four spatial dimensions where the laboratory time is considered as the fourth pseudo-spatial coordinate. Using this procedure and introducing the self action of the electron, its accompanying electromagnetic field and its radiation field are calculated for arbitrary motion. In addition, the Stern-Gerlach effect is revisited for atomic and free electrons.

Geometrical Charged Particle Optics

Author: Harald H. Rose
Editor: Springer Science & Business Media
ISBN: 3540859152
Size: 15,55 MB
Format: PDF, ePub
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This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.

Charged Particle Optics Theory

Author: Timothy R. Groves
Editor: CRC Press
ISBN: 1482229951
Size: 12,39 MB
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Charged Particle Optics Theory: An Introduction identifies the most important concepts of charged particle optics theory, and derives each mathematically from the first principles of physics. Assuming an advanced undergraduate-level understanding of calculus, this book follows a logical progression, with each concept building upon the preceding one. Beginning with a non-mathematical survey of the optical nature of a charged particle beam, the text: Discusses both geometrical and wave optics, as well as the correspondence between them Describes the two-body scattering problem, which is essential to the interaction of a fast charged particle with matter Introduces electron emission as a practical consequence of quantum mechanics Addresses the Fourier transform and the linear second-order differential equation Includes problems to amplify and fill in the theoretical details, with solutions presented separately Charged Particle Optics Theory: An Introduction makes an ideal textbook as well as a convenient reference on the theoretical origins of the optics of charged particle beams. It is intended to prepare the reader to understand the large body of published research in this mature field, with the end result translated immediately to practical application.

Handbook Of Charged Particle Optics Second Edition

Author: Jon Orloff
Editor: CRC Press
ISBN: 9781420045550
Size: 20,75 MB
Format: PDF, Kindle
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With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Applied Charged Particle Optics

Author: Helmut Liebl
Editor: Springer Science & Business Media
ISBN: 9783540719250
Size: 18,22 MB
Format: PDF, ePub, Mobi
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Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.

Charged Particle Optics

Author:
Editor:
ISBN:
Size: 14,87 MB
Format: PDF, ePub
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Applied Charged Particle Optics

Author: Albert L. Septier
Editor: Academic Pr
ISBN: 9780120145768
Size: 18,11 MB
Format: PDF, Docs
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Advances In Imaging And Electron Physics

Author: Dmitry Greenfield
Editor: Academic Press
ISBN: 9780080879697
Size: 11,66 MB
Format: PDF, ePub
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Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.

An Introduction To Beam Physics

Author: Martin Berz
Editor: Taylor & Francis
ISBN: 1420011820
Size: 17,84 MB
Format: PDF, Kindle
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The field of beam physics touches many areas of physics, engineering, and the sciences. In general terms, beams describe ensembles of particles with initial conditions similar enough to be treated together as a group so that the motion is a weakly nonlinear perturbation of a chosen reference particle. Particle beams are used in a variety of areas, ranging from electron microscopes, particle spectrometers, medical radiation facilities, powerful light sources, and astrophysics to large synchrotrons and storage rings such as the LHC at CERN. An Introduction to Beam Physics is based on lectures given at Michigan State University’s Department of Physics and Astronomy, the online VUBeam program, the U.S. Particle Accelerator School, the CERN Academic Training Programme, and various other venues. It is accessible to beginning graduate and upper-division undergraduate students in physics, mathematics, and engineering. The book begins with a historical overview of methods for generating and accelerating beams, highlighting important advances through the eyes of their developers using their original drawings. The book then presents concepts of linear beam optics, transfer matrices, the general equations of motion, and the main techniques used for single- and multi-pass systems. Some advanced nonlinear topics, including the computation of aberrations and a study of resonances, round out the presentation.

Charged Particle Traps Ii

Author: Günther Werth
Editor: Springer Science & Business Media
ISBN: 354092261X
Size: 10,44 MB
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This second volume of the Charged Particle Traps deals with the rapidly expanding body of research exploiting the electromagnetic con?nement of ions, whose principles and techniques were the subject of volume I. These applications include revolutionary advances in diverse ?elds, ranging from such practical ?elds as mass spectrometry, to the establishment of an ult- stable standard of frequency and the emergent ?eld of quantum computing made possible by the observation of the quantum behavior of laser-cooled con?nedions. Bothexperimentalandtheoreticalactivity intheseapplications has proliferated widely, and the number of diverse articles in the literature on its many facets has reached the point where it is useful to distill and organize the published work in a uni?ed volume that de?nes the current status of the ?eld. As explained in volume I, the technique of con?ning charged particles in suitable electromagnetic ?elds was initially conceived by W. Paul as a thr- dimensional version of his rf quadrupole mass ?lter. Its ?rst application to rf spectroscopy on atomic ions was completed in H. G. Dehmelt’s laboratory where notable work was later done on the free electron using the Penning trap. The further exploitation of these devices has followed more or less - dependently along the two initial broad areas: mass spectrometry and high resolution spectroscopy. In volume I a detailed account is given of the theory of operation and experimental techniques of the various forms of Paul and Penning ion traps.